SHINE-EDFAS Workshop 2026
Date: 17 July 2026
Time: 8:45 am to 06:00 pm
Venue: Block E7, 15 Kent Ridge Crescent Singapore 119276
The inaugural NUS SHINE–EDFAS Failure Analysis Workshop in Singapore concluded successfully on 17 July 2026 at the NUS Engineering Campus, Block E7. The workshop recorded a full turnout, welcoming about 180 participants from the semiconductor industry, academia and the research community.
Centred on the theme “Closing the Failure Analysis Gap for the AI-Era Semiconductor Industry”, the workshop brought together industry leaders, failure analysis specialists, equipment innovators and academic researchers to exchange knowledge on emerging challenges and developments in semiconductor failure analysis.
Prof Aaron Thean, Director of the SHINE Centre at NUS, opened the workshop with an introduction to SHINE. This was followed by a welcome address from Mr Julian Pan, CEO and Executive Chairman of SEMICAPS, and an introduction to EDFAS and the workshop programme by Ms Rosalinda M. “Rose” Ring, Director of Applications Engineering at NenoVision.
The technical programme featured presentations by:
- Dr Wen-Hsien Chuang, Technical Director, TSMC
- Ms Susan Li, Technical Director, Marvell
- Ms Grace Tan, Director of Engineering/Failure Analysis, Qualcomm
- Dr Mike Bruce, Vice President of Applications and Engineering, SEMICAPS
- Mr Benny Hsu, Senior Device Analysis Engineer, AMD
- Prof Jeroen Anton Van Kan, Founder of Anton Technology, NUS
- Dr Joseph Liao, Founder and Chief Technology Officer, EnliTech
- Dr Marc Heinemann, Failure Analysis Team Leader, SmarAct
- Mr Greg Johnson, Senior Application Development Engineer, Carl Zeiss
The presentations addressed topics ranging from future failure analysis strategies and advanced packaging to automotive applications, electrical fault analysis, chiplet fault isolation, proton microscopy, silicon photonics, nanoprobing and passive voltage contrast.
The programme culminated in a panel discussion on closing the failure analysis gap for the AI-era semiconductor industry, moderated by Prof Lim Yeow Kheng of NUS SHINE. The discussion brought together perspectives from TSMC, Qualcomm, SEMICAPS and NUS on foundry trends, automotive reliability, the failure analysis technology roadmap and advanced characterisation.
The workshop was jointly organised by the Electronic Device Failure Analysis Society and the SHINE Centre, based at the NUS College of Design and Engineering, with the generous sponsorship of SEMICAPS.
The strong turnout and enthusiastic engagement reflected the importance of collaboration in strengthening failure analysis capabilities for the rapidly evolving semiconductor industry.
